MUREX (X-ray reflectivity software)
Start downloading (zip archive) http ftp (for DOS)
MUREX (Multiple Reflection of X-Rays) is scientific software for calculation/analysis of X-ray reflectivity, fluorescence intensity from multilayered thin films in grazing incidence/exit X-ray experiments.
The latest version of MUREX is available at http://www.nims.go.jp/xray/lab/ or anonymmous ftp ( ftp://ftp.nims.go.jp/pub/murex), although you may find it as well in major computer network (e.g. Society for Computer Chemistry Japan http://www.sccj.net/download/archives/jcpe-prog-index.htm (No.75), CompuServe Scince Forum, Nifty-Serve SCIENCE etc. etc.) .
The following files should be included in this package.
| MUREX118.TXT - this file MUREXPC.EXE - MUREX executable file for IBM PC MUREX98.EXE - MUREX executable file for NEC PC-9801 00.PAR - parameter file (sample) REF00.DAT - reflectivity data (sample) FT00.DAT - Fourier analysis output data (sample) SAKURA.BAT - sample for batch processing GPL.TXT - GNU General Public License (original) GPLJ.TXT - GNU General Public License (in Japanese) MEMO118J.TXT - additional information (in Japanese) ------------ 10 files |
MUREX runs on MS-DOS 3.1 or later.
Those who use PC-9801 (NEC) and IBM PC should rename MUREX98.EXE and MUREXPC.EXE, respectively as MUREX.EXE.
The use of a maths coprocessor (80x87) is strongly recommended. A memory resident hardcopy program is useful to print graphics quickly. For the reader's reference, the author uses the followings:
NEC PC-9801 HARDCOPY.COM, which comes with Borland Pascal/C++
Toshiba Dynabook (IBM PC compatible) GRAPHICS.COM, which comes with Toshiba DOS 5.0 and 6.2/V
The author also frequently uses GNUPLOT (for DOS/WINDOWS) for plotting the final results.
To start MUREX, type the following:
C:\> MUREX (switch, -[r/v/e/i/f/c/h]) (parameter filename)
Each switch corresponds to a different type of calculation or analysis:
| -r calculate theoretical X-ray reflectivity (Ref.1,2) -v display graphics of reflectivity data file -e calculate fluorescent X-ray intensity -i calculate X-ray intensity inside film -f determine layer thickness by Fourier analysis (Ref.3-5) -c determine interface roughness by curve fitting -h show a help menu (default) |
You have to prepare a parameter file and/or a reflectivity data file before starting MUREX.
See the Appendices for details. Samples included in this package may help you. When you use the default condition filename, MUREX.PAR, you only have to type the following:
C:\MUREX (switch, -[r/v/i/e/f/c/h])
This program is free software; you can use, copy and redistribute it under the terms of the GNU General Public License as published by the Free Software Foundation.
This program is distributed in the hope that it will be useful, but without any warranty; without even the implied warranty of fitness for a particular purpose. See the GNU General Public License for more details.
Please send your comments or suggestions to the author at this address:
| Kenji Sakurai |
| National Institute for Materials Science |
| 1-2-1, Sengen, Tsukuba, Ibaraki 305 JAPAN |
| Phone : +81-298-59-2821 |
| Fax : +81-298-59-2801 |
| E-mail: sakurai@yuhgiri.nims.go.jp |
Q01 Downloading is not successful A01 Try another site. It is also possible for us to send the file by e-mail. But downloading for yourself is much much quicker and easier for you. Q02 Is there any Windows version ? A02 We are using the Windows version only for the internal use. The released software is quite old, but it works on Dos-shell in Windows. Q03 I cannot see anything when running the software on my Japanese PC. A03 Try US command to switch the display to English mode. The software does not support non-English environment. Q04 It does not work on my new Pentium PC. What happens ? A04 It is a known problem for the fast PC (later than Pentium 266MHz) and you will find a message something like 'Runtime error: 200 at xxxx:xxxx'. It is possible to fix it if you get a patch program. The list below must be useful. One of our lab members (T. Inoue) examined all of them, and got successful results. Q05 Are the source codes also available ? A05 Unfortunately, the source codes of MUREX will not be distributed to the outside of our laboratory. MUREX binaries can be used freely with free of charge, but it is not a free software in an exact sense. Q06 How can I prepare the parameter files ? A06 Use a text editor - you may prepare the files in both Windows and Dos environment. Q07 Can I calculate X-ray fluorescence intensity for any elements ? A07 Actually, the software does not consider the kind of elements. The calculation just shows its angular/depth dependence. You can calculate the angular profile, if you specify the depth which the interested elements are located.
ftp://ftp.nims.go.jp/pub/murex
ftp://cherry.hinet.tsuchiura.ibaraki.jp/pub/murex
http://www.sccj.net/download/archives/jcpe-prog-index.htm
http://www.multiboard.com/
Andreas Bauer
tppatch.zip
http://www.simtel.net/
Eugene Toder
crtfix16.zip
http://members.cox.net/dos/
Marek "MAF" Futrega
tp7p5fix.zip
Pixel
prot200.zip
Bret Johnson
slodn310.zip
PHaX
bppat102.zip
1) L.G.Parratt, Phys. Rev. 95(1954)359.
2) S.K.Sinha et al., Phys. Rev. 38(1988)2297.
3) K.Sakurai and A.Iida, Jpn. J. Appl. Phys. 31(1992)L113.
4) K.Sakurai and A.Iida, Adv. in X-Ray Anal. 35(1992)813.
5) K.Sakurai, Bulletin of the Japan Institute of Metals [Nippon Kinzoku Gakkai-ho] 32(1993)323. (in Japanese)
6) K.N.Stoev and K.Sakurai, Spectrochim. Acta B54, 41-82 (1999).
7) O.Starykov and K.Sakurai, Appl. Surf. Sci. 244, 235-239 (2005)
JAPANESE
